RF performance of passive components on state-of-art trap rich silicon-on-insulator substrates

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Authors: Lei Zhu, Shuangke Liu, F. Allibert, E. Desbonnets, I. Radu, Xinen Zhu, Yumin Lu

Journal title: 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-2

DOI identifier: 10.1109/VLSI-TSA.2016.7480530

ISBN: 978-1-4673-9478-9