RF Characteristics of Two Generations of RFeSI HR-SOI Substrates Over Temperature

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Authors: Lei Zhu, Shuangke Liu, Frederic Allibert, Ionut Radu, Xinen Zhu, Yumin Lu, Xi Wang

Journal title: IEEE Microwave and Wireless Components Letters

Journal number: 28/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 377-379

DOI identifier: 10.1109/lmwc.2018.2813884

ISSN: 1531-1309