RF Small- and Large-Signal Characteristics of CPW and TFMS Lines on Trap-Rich HR-SOI Substrates

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Babak Kazemi Esfeh, Martin Rack, Khaled Ben Ali, Frederic Allibert, Jean-Pierre Raskin

Journal title: IEEE Transactions on Electron Devices

Journal number: 65/8

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 3120-3126

DOI identifier: 10.1109/ted.2018.2845679

ISSN: 0018-9383