Electrically Active Defects in SiC Schottky Diodes

Summary

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Authors: DROBNÝ, Jakub - CHVÁLA, Aleš – KOSA, Arpad - MESSINA, Angelo Alberto - STUCHLÍKOVÁ, Ľubica - DONOVAL, Daniel

Journal title: Comenius University, 2020, S. 17-18

Journal publisher: Comenius University, 2020, S. 17-18

Published year: 2020