Evaluation of VTH and RON Drifts during Switch-Mode Operation in Packaged SiC MOSFETs

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Authors: Marcello Cioni, Alessandro Bertacchini, Alessandro Mucci, Nicolò Zagni, Giovanni Verzellesi, Paolo Pavan, Alessandro Chini

Journal title: Electronics

Journal number: 10/4

Journal publisher: MDPI

Published year: 2021

Published pages: 441

DOI identifier: 10.3390/electronics10040441

ISSN: 2079-9292