Nanoscale Insights on the Origin of the Power MOSFETs Breakdown after Extremely Long High Temperature Reverse Bias Stress

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Patrick Fiorenza, Mario Alessandrino, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Edoardo Zanetti, Corrado Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte

Journal title: Materials Science Forum

Journal number: 1004

Journal publisher: Scientific.Net

Published year: 2020

Published pages: 433-438

DOI identifier: 10.4028/www.scientific.net/msf.1004.433

ISSN: 1662-9752