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Authors: Nicola Capodieci, Paolo Burgio, Roberto Cavicchioli, Ignacio Sanudo Olmedo, Marco Solieri, Marko Bertogna
Journal title: IEEE Design & Test
Journal publisher: IEEE Computer Society
Published year: 2020
Published pages: 1-1
DOI identifier: 10.1109/mdat.2020.3013828
ISSN: 2168-2356