DESIGN OF DOUBLE-PULSE TESTER FOR ON-DIE MEASUREMENT OF GAN HEMT DYNAMIC ON-RESISTANCE

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Authors: KOZÁRIK, Jozef - MAREK, Juraj - CHVÁLA, Aleš - MINÁRIK, Michal - DONOVAL, Martin - JAGELKA, Martin - DONOVAL, Daniel

Journal title: Advances in Electronic and Photonic Technologies - ADEPT 2020

Journal number: 14-17. 09. 2020

Journal publisher: EDIS

Published year: 2020

Published pages: 111-114

ISBN: 978-80-554-1735-6