Thermal Stress Reduction of Power MOSFET in Electric Drive Application with Dynamic Gate Driving Strategy

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Authors: Lie Wang, Bas Vermulst, Jorge Duarte, Henk Huisman

Journal title: 2021 IEEE Applied Power Electronics Conference and Exposition (APEC)

Journal number: 21 July 2021

Journal publisher: IEEE

Published year: 2021

Published pages: 720-727

DOI identifier: 10.1109/apec42165.2021.9487385

ISBN: 978-1-7281-8949-9