Degradation of 600V GaN HEMTs under Repetitive Short Circuit Conditions

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Authors: J. Kozarik, J. Marek, M. Minarik, A. Chvala, L. Cernaj, M. Donoval, D. Donoval

Journal title: 2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM)

Journal publisher: IEEE

Published year: 2020

Published pages: 127-130

DOI identifier: 10.1109/asdam50306.2020.9393866

ISBN: 978-1-7281-9776-0