A Chip Integrity Monitor for Evaluating Moisture/Ion Ingress in mm-Sized Single-Chip Implants

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Authors: Omer Can Akgun, Kambiz Nanbakhsh, Vasiliki Giagka, Wouter A. Serdijn

Journal title: IEEE Transactions on Biomedical Circuits and Systems

Journal number: 14/4

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 658-670

DOI identifier: 10.1109/tbcas.2020.3007484

ISSN: 1932-4545