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Authors: Jose Luis de la Vara, Beatriz Marin, Giovanni Giachetti, Clara Ayora
Journal title: Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '16
Journal publisher: ACM Press
Published year: 2016
Published pages: 1-6
DOI identifier: 10.1145/2961111.2962621
ISBN: 9781-450344272