NBTI and HCI models for circuit level aging simulations in different EDA environments

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Authors: Velarde Gonzalez, F.A.; Lange, A.; Crocoll, S.; Jancke, R.

Journal title: ESREF 2018, 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

Journal publisher: N/A

Published year: 2018

DOI identifier: 10.5281/zenodo.2558154