Toward consistent circuit-level aging simulationsin different EDA environments

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Fabio A. Velarde Gonzalez, Kay-Uwe Giering, André Lange, Insaf Lahbib, Sonja Crocoll

Journal title: "31. GI/GMM/ITG-Workshop ""Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"" (TUZ 2019)"

Journal number: 24th-26th February 2019

Journal publisher: N/A

Published year: 2019