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Authors: Mirco Muttillo, Vittoriano Muttillo, Luigi Pomante, Leonardo Pantoli
Journal title: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT
Journal publisher: IEEE
Published year: 2020
Published pages: 191-196
DOI identifier: 10.1109/metroind4.0iot48571.2020.9138191
ISBN: 978-1-7281-4892-2