Run-time Monitoring and Trace Analysis Methodology for Component-based Embedded Systems Design Flow

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Authors: V. Muttillo, G. Valente, L. Pomante, H. Posadas, J. Merino, E. Villar

Journal title: IEEE proc. of the 2020 Conference on Digital System Design, DSD 2020

Journal number: August 2020

Journal publisher: IEEE

Published year: 2020