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Authors: Saeid Dehnavi, Dip Goswami, Martijn Koedam, Andrew Nelson, Kees Goossens
Journal title: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2021
Published pages: 1148-1151
DOI identifier: 10.23919/date51398.2021.9474221
ISBN: 978-3-9819263-5-4