Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress

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Authors: Zhan Gao, Fabiana Rampazzo, Matteo Meneghini, Nicola Modolo, Carlo De Santi, Hervé Blanck, Hermann Stieglauer, Daniel Sommer, Jan Grünenpütt, Olof Kordina, Jr-Tai Chen, Gaudenzio Meneghesso, Enrico Zanoni

Journal title: Microelectronics Reliability

Journal publisher: Elsevier BV

Published year: 2021

Published pages: 114318

DOI identifier: 10.1016/j.microrel.2021.114318

ISSN: 0026-2714