A humidity-induced novel failure mechanism in power semiconductor diodes

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Authors: J. Leppänen, G. Ross, V. Vuorinen, J. Ingman, J. Jormanainen, M. Paulasto-Kröckel

Journal title: Microelectronics Reliability

Journal number: 123

Journal publisher: Elsevier BV

Published year: 2021

Published pages: 114207

DOI identifier: 10.1016/j.microrel.2021.114207

ISSN: 0026-2714