Study of Emission and Capture Processes in Semi-vertical GaN-on-Si Trench-MOSFETs

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Authors: J. Drobny, J. Marek, A. Kosa, K. Geens, M. Borga, H. Liang, S. You, S. Decoutere, L. Stuchlikova

Journal title: 2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM)

Journal publisher: IEEE

Published year: 2020

Published pages: 123-126

DOI identifier: 10.1109/asdam50306.2020.9393836

ISBN: 978-1-7281-9776-0