DLTS study of electrically active defects in semi-vertical GaN-on-Si FETs.

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Authors: DROBNÝ, Jakub - MAREK, Juraj - KÓSA, Arpád - VADOVSKÝ, Jakub - GEENS, Karen - BORGA, Matteo - LIANG, Hu - YOU, Shuzhen - DECOUTERE, Stefaan - STUCHLÍKOVÁ

Journal title: Proc. of 11th Solid State Surfaces and Interfaces (Extended abstract book)

Journal publisher: Comenius University Bratislava

Published year: 2020