Degradation of 600V GaN HEMT with p-GaN gate under repetitive short circuit stress

Summary

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Authors: KOZÁRIK, Jozef - MAREK, Juraj - MINÁRIK, Michal - CHVÁLA, Aleš - GAŠPAREK, Krisztián - JAGELKA, Martin - DONOVAL, Martin

Journal title: 9th International conference on advances in electronic and photonic technologies

Journal publisher: EDIS

Published year: 2021

ISBN: 978-80-554-1806-3