Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices.

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Authors: MAREK, Juraj - MIKOLÁŠEK, Miroslav - DROBNÝ, Jakub - KOZÁRIK, Jozef - CHVÁLA, Aleš - GEENS, K. - BORGA, Matteo - LIANG, Hu - YOU, Shuzhen - DECOUTERE, Stefaan - STUCHLÍKOVÁ, Ľubica

Journal title: Proc. of 11th Solid State Surfaces and Interfaces (Extended abstract book)

Journal publisher: Comenius University Bratislava

Published year: 2020