Vertical GaN devices: Process and reliability

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Authors: Shuzhen You, Karen Geens, Matteo Borga, Hu Liang, Herwig Hahn, Dirk Fahle, Michael Heuken, Kalparupa Mukherjee, Carlo De Santi, Matteo Meneghini, Enrico Zanoni, Martin Berg, Peter Ramvall, Ashutosh Kumar, Mikael T. Björk, B. Jonas Ohlsson, Stefaan Decoutere,

Journal title: Microelectronics Reliability

Journal publisher: Elsevier BV

Published year: 2021

DOI identifier: 10.1016/j.microrel.2021.114218

ISSN: 0026-2714