Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

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Authors: Kalparupa Mukherjee, Matteo Borga, Maria Ruzzarin, Carlo De Santi, Steve Stoffels, Shuzhen You, Karen Geens, Hu Liang, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Journal title: Applied Physics Express

Journal number: 13/2

Journal publisher: Japan Soc of Applied Physics

Published year: 2020

Published pages: 024004

DOI identifier: 10.35848/1882-0786/ab6ddd

ISSN: 1882-0778