Summary
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Authors: Xiangdong Li, Karen Geens, Dirk Wellekens, Ming Zhao, Alessandro Magnani, Nooshin Amirifar, Benoit Bakeroot, Shuzhen You, Dirk Fahle, Herwig Hahn, Michael Heuken, Vlad Odnoblyudov, Ozgur Aktas, Cem Basceri, Denis Marcon, Guido Groeseneken, Stefaan Decoutere
Journal title: IEEE Transactions on Semiconductor Manufacturing
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
Published pages: 534 - 538
DOI identifier: 10.1109/tsm.2020.3017703
ISSN: 0894-6507