Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

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Authors: E. Fabris; M. Borga; N. Posthuma; M. Zhao; B. De Jaeger; S. You; S. Decoutere; M. Meneghini; G. Meneghesso; E. Zanoni

Journal title: IEEE International Reliability Physics Symposium (IRPS)

Journal number: 21-25 March 2021

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/irps46558.2021.9405097

ISBN: 978-1-7281-6893-7