LiNiO Gate Dielectric with Tri-Gate Structure for High Performance E-mode GaN transistors

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Authors: Taifang Wang, Mohammad Samizadeh Nikoo, Luca Nela, Elison Matioli

Journal title: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Journal publisher: IEEE

Published year: 2021

Published pages: 135-138

DOI identifier: 10.23919/ispsd50666.2021.9452252

ISBN: 978-4-88686-422-2