Degradation of 600V GaN HEMTs under repetitive short circuit conditions

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Authors: KOZÁRIK, Jozef - MAREK, Juraj - MINÁRIK, Michal - CHVÁLA, Aleš - DEBNÁR, Tomáš - DONOVAL, Martin - STUCHLÍKOVÁ, Ľubica

Journal title: ISPS '21 : 15th International Seminar on Power Semiconductors

Journal publisher: Czech Technical University in Prague

Published year: 2021

ISBN: 978-80-01-06874-8