Security, Reliability and Test Aspects of the RISC-V Ecosystem

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Authors: Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gurkaynak, Helena Handschuh, Carles Hernandez, Mike Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, Francesco Regazzoni

Journal title: 2021 IEEE European Test Symposium (ETS)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-10

DOI identifier: 10.1109/ets50041.2021.9465449

ISBN: 978-1-6654-1849-2