Simulated effects of wet-etched induced surface roughness on IR transmission and reflection

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Authors: Phillip Papatzacos, M. Nadeem Akram, Eivind Bardalen, Per Ohlckers

Journal title: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-4

DOI identifier: 10.1109/estc48849.2020.9229821

ISBN: 978-1-7281-6293-5