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Authors: V. Vuorinen, H. Dong, G. Ross, J. Hotchkiss, J. Kaaos, M. Paulasto-Kröckel
Journal title: Journal of Electronic Materials
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
DOI identifier: 10.1007/s11664-020-08530-y
ISSN: 0361-5235