Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI

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Authors: Lucas Nyssens, Martin Rack, Arka Halder, Martin Vanbrabant, Valeriya Kilchytska, Jean-Pierre Raskin

Journal title: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-2

DOI identifier: 10.1109/vlsi-tsa51926.2021.9440125

ISBN: 978-1-6654-1934-5