On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Lucas Nyssens, M. Rack, A. Halder, J.-P. Raskin, V. Kilchytska

Journal title: IEEE Electron Device Letters

Journal number: 42/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 665-668

DOI identifier: 10.1109/led.2021.3071272

ISSN: 0741-3106