Assessment of RF compact modelling of FD SOI transistors

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Authors: Martin Vanbrabant, Lucas Nyssens, Valeriya Kilchytska, Jean-Pierre Raskin

Journal title: 2021 IEEE Latin America Electron Devices Conference (LAEDC)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-3

DOI identifier: 10.1109/laedc51812.2021.9437955

ISBN: 978-1-6654-1510-1