Chapter 3 EMC oxidation under high temperature aging

Summary

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Authors: A. Inamdar, P. Gromala, A. Prisacaru, A. Kabakchiev, Y. Yang, B. Han

Journal title: Reliability of organic compounds in microelectronics and optoelectronics

Journal number: 1

Journal publisher: Springer

Published year: 2021

Published pages: 26