Study of the Thermomechanical Strain Induced by Current Pulses in SiC-Based Power MOSFET

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Authors: Anoldo Laura, Triolo Claudia, Panarello Saverio, Garescì Francesca, Russo Sebastiano, Messina Angelo Alberto , Calabretta Michele , and Patanè Salvatore

Journal title: IEEE Electron Device Letters

Journal number: volume 42

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/led.2021.3077064

ISSN: 1558-0563