EKV MOS Transistor Model For Ultra Low-Voltage Bulk-Driven IC Design

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Authors: Lukas Nagyt, Daniel Arbet, Martin Kovac, Miroslav Potocny, Michal Sovcik, Viera Stopjakova

Journal title: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2021

Published pages: 6-10

DOI identifier: 10.1109/ddecs52668.2021.9417051

ISBN: 978-1-6654-3595-6