Reliability of Electronic Drivers: An Industrial Approach

Summary

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Authors: P. Watté, G. van Hees, R. Engelen, W. D. van Driel, T. Chen

Journal title: 18th China International Forum on Solid State Lighting & 2021 7th International Forum on Wide Bandgap Semiconductors

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/sslchinaifws54608.2021.9675170