Reliability of Electronic Drivers: An Industrial Approach

Summary

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Authors: P. Watté, G. van Hees, R. Engelen, W. D. van Driel

Journal title: ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems

Journal publisher: ASME

Published year: 2021

DOI identifier: 10.1115/ipack2021-72293