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Authors: W. D. van Driel, B. J. C. Jacobs, G. Onushkin, P. Watte, X. Zhao, J. Lynn Davis
Journal title: Reliability of Organic Compounds in Microelectronics and Optoelectronics
Journal publisher: Springer
Published year: 2022
DOI identifier: 10.1007/978-3-030-81576-9_7
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