ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs

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Authors: Lukas Hahne, G. Fabio A. Velarde, André Lange, Christoph Sohrmann, Daniel Wetzel, Sonja Crocoll

Journal title: IEEE International Integrated Reliability Workshop (IIRW)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/iirw53245.2021.9635606