Reliability of LED-based Systems

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Authors: Willem D. van Driel, B. Jacobs, P. Watte, X. Zhao

Journal title: 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-4

DOI identifier: 10.1109/eurosime52062.2021.9410861

ISBN: 978-1-6654-1373-2