POWER SIC MOSFET UNDER REPETITIVE UIS AND SHORT CIRCUIT STRESS

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Authors: J. Marek1, J. Kozárik, A. Chvála, M. Minárik and M. Donoval

Journal title: Advances in Electronic and Photonic Technologies (ADEPT 2021)

Journal publisher: University of Zilina in EDIS-Publishing Centre of UZ

Published year: 2021

ISBN: 978-80-554-1806-3