A Method Based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices

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Authors: Piero Baraldi, Stefano Medici, Ibrahim Ahmed, Enrico Zio, Horst Lewitschnig

Journal title: Proceedings of the 31st European Safety and Reliability Conference (ESREL 2021)

Journal publisher: Research Publishing Services

Published year: 2021

Published pages: 2619-2626

DOI identifier: 10.3850/978-981-18-2016-8_763-cd

ISBN: 978-981-18-2016-8