Microstructural Degradation Investigations of OFF-State Stressed 0.15 μm RF AlGaN/GaN HEMTs: Failure Mode related Breakdown

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Authors: Prabha Sana, Andreas Graff, Michel Simon-Najasek, Susanne Huebner, Veronica Zhan Gao, Fabiana Rampazzo, Carlo De Santi, Benoit Lambert, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Frank Altmann

Journal title: IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/wipda49284.2021.9645151