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Authors: Norbert Koster, Edwin te Sligte, Freek Molkenboer, Alex Deutz, Peter van der Walle, Pim Muilwijk, Wouter Mulckhuyse, Bastiaan Oostdijck, Christiaan Hollemans, Björn Nijland, Peter Kerkhof, Michel van Putten, Jeroen Westerhout
Journal title: Extreme Ultraviolet (EUV) Lithography VIII
Journal publisher: SPIE
Published year: 2017
Published pages: 101431N
DOI identifier: 10.1117/12.2257997