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Authors: Ivan Pollentier, Jae Uk Lee, Marina Timmermans, Christoph Adelmann, Houman Zahedmanesh, Cedric Huyghebaert, Emily E. Gallagher
Journal title: Extreme Ultraviolet (EUV) Lithography VIII
Journal number: 01430L (24 March 2017)
Journal publisher: SPIE
Published year: 2017
Published pages: 101430L
DOI identifier: 10.1117/12.2257891