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Authors: Enio Vasconcelos Filho; Pedro M. Santos; Ricardo Severino; Anis Koubaa; Eduardo Tovar
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
Published pages: 45562 - 45575
DOI identifier: 10.1109/access.2022.3169415
ISSN: 2169-3536