The influence of the rapid thermal annealing process on defect distribution in GaAsN Schottky diodes.

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Authors: KÓSA, Arpád - DAWIDOWSKI, Wojciech - SCIANA, Beata - CHVÁLA, Aleš - STUCHLÍKOVÁ, Ľubica

Journal title: SURFINT - SREN VII

Journal publisher: Comenius University

Published year: 2021